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A data-driven stochastic collocation approach for uncertainty quantification in MEMS

✍ Scribed by Nitin Agarwal; N. R. Aluru

Publisher: John Wiley and Sons
Year: 2010
Tongue: English
Weight: 352 KB
Volume: 83
Category: Article
ISSN: 0029-5981
DOI: 10.1002/nme.2844

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