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A consistent experimental method for the extraction of the threshold voltage of SOI nMOSFETs from room down to cryogenic temperatures

✍ Scribed by A.L.P. Rotondaro; U. Magnusson; E. Simoen; C. Claeys


Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
303 KB
Volume
36
Category
Article
ISSN
0038-1101

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