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A computerized data acquisition system for measuring planarity deviations with electronic levels

✍ Scribed by V. I. Teleshevskii; A. V. Glubokov

Publisher: Springer US
Year: 2004
Tongue: English
Weight: 47 KB
Volume: 47
Category: Article
ISSN: 0543-1972
DOI: 10.1007/s11018-004-0004-x

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