A Comprehensive Understanding of the Erase of TANOS Memories Through Charge Separation Experiments and Simulations

✍ Scribed by Padovani, A.; Arreghini, A.; Vandelli, L.; Larcher, L.; Van den bosch, G.; Pavan, P.; Van Houdt, J.

• Book ID: 114620597
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 920 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2159722