A comprehensive review of the lognormal failure distribution with application to led reliability : A. S. Jordan. Microelectron. Reliab. 18, 267 (1978)

• Book ID: 103277991
• Publisher: Elsevier Science
• Year: 1979
• Tongue: English
• Weight: 128 KB
• Volume: 19
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(79)90183-5