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A comprehensive electron paramagnetic resonance study of influence of annealing on defect center in phosphorus ion-implanted C60 films

✍ Scribed by N.F Fahim; N Kojima; M Yamaguchi; Y Ohshita; A Eid; B Barsoum


Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
204 KB
Volume
5
Category
Article
ISSN
1369-8001

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