A comparison of the various thermal treatments of chemically deposited bismuth sulfide thin films and the effect on the structural and electrical properties
✍ Scribed by M.E Rincón; J Campos; R Suárez
- Book ID
- 108357691
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 280 KB
- Volume
- 60
- Category
- Article
- ISSN
- 0022-3697
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## Abstract Thin films of bismuth were evaporated onto polished Si(100) substrates at substrate growth temperatures which varied between 25 and 100° C. The variations in film morphology observed using the scanning electron microscope and atomic force microscope were compared to changes in the optic