✦ LIBER ✦
A Comparison of the Microwave Photoconductivity Decay and Open-Circuit Voltage Decay Lifetime Measurement Techniques for Lifetime-Enhanced 4H-SiC Epilayers
✍ Scribed by Van Brunt, Edward; Agarwal, Anant; Burk, Al; Cheng, Lin; O’Loughlin, Michael; Palmour, John; Suvorov, Alexander
- Book ID
- 121610003
- Publisher
- Springer US
- Year
- 2013
- Tongue
- English
- Weight
- 310 KB
- Volume
- 43
- Category
- Article
- ISSN
- 0361-5235
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