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A comparison of MOSFETs aging under d.c., a.c. and alternating stress conditions

โœ Scribed by Nathalie Revil; Sorin Cristoloveanu; Patrick Mortini


Book ID
103282592
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
525 KB
Volume
33
Category
Article
ISSN
0026-2714

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โœ R.R. Brooks; C.R. Boswell ๐Ÿ“‚ Article ๐Ÿ“… 1965 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 631 KB

IZeforc the intr~)du~tion of cathode-layer cxcitntion in the D.C. arcI, anode excitation was the usual tf2i:tinicpe in spcctrochernicnl analysis. Although the use of ancJdC! cscitation derlincd s<>mc\vhi~t following the discovery of the cathode-layer effect, it has been more widely usctf in recent y