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A Comparison of Key PV Backsheet and Module Performance from Fielded Module Exposures and Accelerated Tests

✍ Scribed by Gambogi, W.; Heta, Y.; Hashimoto, K.; Kopchick, J.; Felder, T.; MacMaster, S.; Bradley, A.; Hamzavytehrany, B.; Garreau-Iles, L.; Aoki, T.; Stika, K.; Trout, T. J.; Sample, T.

Book ID: 125523150
Publisher: Institute of Electrical and Electronics Engineers
Year: 2014
Tongue: English
Weight: 519 KB
Volume: 4
Category: Article
ISSN: 2156-3381
DOI: 10.1109/JPHOTOV.2014.2305472

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