A Comparison of Ionizing Radiation Damage in MOSFETs from Cobalt-60 Gamma Rays, 0.5 TO 22 MeV Protons and 1 to 7 MeV Electrons

✍ Scribed by Tallon, R. W.; Ackermann, M. R.; Kemp, W. T.; Owen, M. H.; Saunders, D. P.

• Book ID: 114663207
• Publisher: IEEE
• Year: 1985
• Tongue: English
• Weight: 1009 KB
• Volume: 32
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1985.4334130