✦ LIBER ✦
A Comparison of Different Multiple-Crystal Diffractometer Arrangements to Measure the Reflection Curve of SiGe Layers on Si Substrates
✍ Scribed by Dr. sc. P. Zaumseil
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 593 KB
- Volume
- 31
- Category
- Article
- ISSN
- 0232-1300
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