A Comparison of Conventional 60Co Testing and Low Dose-Accumulation-Rate Exposure of Metal-Gate CMOS IC's

✍ Scribed by Roeske, Stanley B.; Edwards, William H.; Zipay, James W.; Puariea, Jack W.; Gammill, Paul E.

• Book ID: 114663096
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 804 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.1984.4333556