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A comparison of carbon contaminant buildup on conductors and insulators in X-ray photoelectron spectroscopy

✍ Scribed by E.S. Brandt; D.F. Untereker; C.N. Reilley; Royce W. Murray


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
593 KB
Volume
14
Category
Article
ISSN
0368-2048

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Amoco M40 PAN-based carbon Ðbers were electrochemically oxidized in a pilot plant system. The changes in the surface of the Ðbers were monitored using monochromatic x-ray photoelectron spectroscopy (XPS). A parallel experiment using achromatic x-radiation was conducted for comparison. Other graphiti