A comparison of atomic force microscopy (AFM) and dynamic light scattering (DLS) methods to characterize nanoparticle size distributions

✍ Scribed by Christopher M. Hoo; Natasha Starostin; Paul West; Martha L. Mecartney

• Publisher: Springer Netherlands
• Year: 2008
• Tongue: English
• Weight: 377 KB
• Volume: 10
• Category: Article
• ISSN: 1388-0764
• DOI: 10.1007/s11051-008-9435-7