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A comparison between thermal annealing and UV-radiation annealing of γ-irradiated NMOS transistors

✍ Scribed by Pejović, M. ;Ristić, G. ;Golubović, S.


Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
246 KB
Volume
140
Category
Article
ISSN
0031-8965

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