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A comparison between the method based on a rigorous field analysis and the impedance transformation method for the intrinsic surface impedance of superconductor films

✍ Scribed by J.H. Lee; Sang Young Lee

Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 331 KB
Volume: 445-448
Category: Article
ISSN: 0921-4534
DOI: 10.1016/j.physc.2006.06.017

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✦ Synopsis

In obtaining the intrinsic surface resistance (R S ) from the effective surface resistance (R S,eff ) measured at microwave frequencies by using the dielectric resonator method, the impedance transformation method reported by Klein et al.

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