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A comparison between excimer laser and thermal annealing for ion-implanted polycrystalline silicon solar cells

โœ Scribed by W. Sinke; A. Polman; F.W. Saris


Publisher
Elsevier Science
Year
1987
Weight
412 KB
Volume
20
Category
Article
ISSN
0379-6787

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โœฆ Synopsis


PolycrystaUine silicon (Wacker-SILSO) solar cells have been made by phosphorus implantation in combination with pulsed excimer laser annealing or thermal annealing. It was found that laser annealing yields cells with a short-circuit current which is 3% -4% higher than that obtained by thermal annealing, whereas the open-circuit voltage is the same for both cases. It was concluded from curve fitting that the current-voltage characteristics of all cells could be described well using a double-exponential model.


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