✦ LIBER ✦
A comparison between atomic concentration profiles and defect density profiles in GaAs annealed after implantation with beryllium
✍ Scribed by K. S. Lee; J. M. Ess; M. A. Littlejohn; R. B. Benson; J. Comas
- Book ID
- 112814850
- Publisher
- Springer US
- Year
- 1980
- Tongue
- English
- Weight
- 676 KB
- Volume
- 9
- Category
- Article
- ISSN
- 0361-5235
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