Microstructure of N-face InN grown on Si
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Dimitrakopulos, G. P. ;Kehagias, Th. ;Ajagunna, A. ;Kioseoglou, J. ;Kerasiotis,
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Article
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2010
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John Wiley and Sons
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English
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## Abstract The structural properties of 2โยตm thick Nโface InN film, grown on Si (111) by plasma source molecular beam epitaxy after the initial deposition of 20โnm AlN and 40โnm GaN, were examined by transmission electron microscopy. The lattice mismatched GaN/AlN and InN/GaN interfaces limited th