A Comparative Study of Surface-Roughness-Induced Variability in Silicon Nanowire and Double-Gate FETs

✍ Scribed by Cresti, A.; Pala, M.G.; Poli, S.; Mouis, M.; Ghibaudo, G.

• Book ID: 114620506
• Publisher: IEEE
• Year: 2011
• Tongue: English
• Weight: 731 KB
• Volume: 58
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2011.2147318