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A comparative study of plasma enhanced chemically vapor deposited SiOH and SiNCH films using the environmentally benign precursor diethylsilane

✍ Scribed by R.A Levy; L Chen; J.M Grow; Y Yu


Book ID
117356655
Publisher
Elsevier Science
Year
2002
Tongue
English
Weight
118 KB
Volume
54
Category
Article
ISSN
0167-577X

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