A comparative study of induced damage after irradiation with swift heavy ions, neutrons and electrons in low doped silicon

✍ Scribed by P Mangiagalli; M Levalois; P Marie

• Book ID: 114170460
• Publisher: Elsevier Science
• Year: 1998
• Tongue: English
• Weight: 144 KB
• Volume: 146
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(98)00473-x