✦ LIBER ✦
A comparative 1/f noise study of GeOI wafers obtained by the Ge enrichment technique and the Smart Cut technology
✍ Scribed by M. Valenza; J. El Husseini; J. Gyani; F. Martinez; M. Bawedin; C. Le Royer; E. Augendre; J.F. Damlencourt
- Book ID
- 104052997
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 602 KB
- Volume
- 88
- Category
- Article
- ISSN
- 0167-9317
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