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A Compact RF CMOS Modeling for Accurate High-Frequency Noise Simulation in Sub-100-nm MOSFETs

✍ Scribed by Jyh Chyurn Guo; Yi Min Lin

Book ID: 117908168
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 581 KB
Volume: 27
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2008.927736

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