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A compact new-concept ellipsometer for accurate large scale thin film measurements

✍ Scribed by Koops, Richard; Sonin, Petro; van Veghel, Marijn; El Gawhary, Omar


Book ID
123613177
Publisher
Institute of Physics
Year
2014
Tongue
English
Weight
858 KB
Volume
16
Category
Article
ISSN
2040-8978

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