A compact model for NBTI degradation and recovery under use-profile variations and its application to aging analysis of digital integrated circuits

✍ Scribed by Kleeberger, Veit B. (author);Barke, Martin (author);Werner, Christoph (author);Schmitt-Landsiedel, Doris (author);Schlichtmann, Ulf (author)

• Book ID: 121465595
• Publisher: Elsevier Ltd
• Year: 2014
• Tongue: English
• Weight: 955 KB
• Volume: 54
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/j.microrel.2013.12.002