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A Common Language Framework for Next-Generation Embedded Testing

โœ Scribed by Portolan, M.; Goyal, S.; Van Treuren, B.; Chiang, C.; Chakraborty, T.; Cook, T.


Book ID
119807658
Publisher
IEEE
Year
2010
Tongue
English
Weight
454 KB
Volume
27
Category
Article
ISSN
0740-7475

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