✦ LIBER ✦
A Combined Study of p- and n-Channel MOS Devices to Investigate the Energetic Distribution of Oxide Traps After NBTI
✍ Scribed by Aichinger, T.; Nelhiebel, M.; Grasser, T.
- Book ID
- 114619821
- Publisher
- IEEE
- Year
- 2009
- Tongue
- English
- Weight
- 666 KB
- Volume
- 56
- Category
- Article
- ISSN
- 0018-9383
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