A combined SNMS and EFTEM/EELS study on focused ion beam prepared vanadium nitride thin films

✍ Scribed by Gerald Kothleitner; M. Rogers; A. Berendes; W. Bock; B.O. Kolbesen

• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 825 KB
• Volume: 252
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2005.02.013