✦ LIBER ✦
A characterization technique for the degradation characteristics of Ti/Si schottky-barrier diodes and ohmic contacts after thermal silicidation
✍ Scribed by Yung-Song Lou; Ching-Yuan Wu
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 524 KB
- Volume
- 37
- Category
- Article
- ISSN
- 0038-1101
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