✦ LIBER ✦

A characterization technique for second breakdown in Ge alloyed junction transistors

✍ Scribed by Agatsuma, T.

Book ID: 114589025
Publisher: IEEE
Year: 1966
Tongue: English
Weight: 344 KB
Volume: ED-13
Category: Article
ISSN: 0018-9383
DOI: 10.1109/t-ed.1966.15753

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