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A calibrated atomic force microscope using an orthogonal scanner and a calibrated laser interferometer

✍ Scribed by Dong-Yeon Lee; Dong-Min Kim; Dae-Gab Gweon; Jinwon Park

Publisher: Elsevier Science
Year: 2007
Tongue: English
Weight: 798 KB
Volume: 253
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2006.08.027

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