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A Build-in Self-Test Technique for RF Low-Noise Amplifiers

✍ Scribed by Yen-Chih Huang, ; Hsieh-Hung Hsieh, ; Liang-Hung Lu,

Book ID: 111645819
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 634 KB
Volume: 56
Category: Article
ISSN: 0018-9480
DOI: 10.1109/TMTT.2008.921293

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