A buckling-based metrology for measuring the elastic moduli of polymeric thin films

✍ Scribed by Stafford, Christopher M.; Harrison, Christopher; Beers, Kathryn L.; Karim, Alamgir; Amis, Eric J.; VanLandingham, Mark R.; Kim, Ho-Cheol; Volksen, Willi; Miller, Robert D.; Simonyi, Eva E.

• Book ID: 109933502
• Publisher: Nature Publishing Group
• Year: 2004
• Tongue: English
• Weight: 372 KB
• Volume: 3
• Category: Article
• ISSN: 1476-1122
• DOI: 10.1038/nmat1175