𝔖 Bobbio Scriptorium
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A biaxial probe for nondestructive testing on conductive materials

✍ Scribed by Bernieri, A.; Betta, G.; Ferrigno, L.; Laracca, M.


Book ID
114629574
Publisher
IEEE
Year
2004
Tongue
English
Weight
571 KB
Volume
53
Category
Article
ISSN
0018-9456

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