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A Bias-Dependent Single-Event Compact Model Implemented Into BSIM4 and a 90 nm CMOS Process Design Kit

✍ Scribed by Kauppila, Jeffrey S.; Sternberg, Andrew L.; Alles, Michael L.; Francis, A. Matt; Holmes, Jim; Amusan, Oluwole A.; Massengill, Lloyd W.


Book ID
126603734
Publisher
IEEE
Year
2009
Tongue
English
Weight
727 KB
Volume
56
Category
Article
ISSN
0018-9499

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