A beam intensity profile monitor based on secondary electron emission

✍ Scribed by A.R. Berdoz; J. Birchall; J.R. Campbell; C.A. Davis; N.E. Davison; P.W. Green; M. Knoll; E. Korkmaz; R.E. Mischke; D.R. Mosscrop; S.A. Page; W.D. Ramsay; G. Roy; A.M. Sekulovich; J. Soukup; G.M. Stinson; J. Stewart; W.T.H. van Oers

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 653 KB
• Volume: 307
• Category: Article
• ISSN: 0168-9002
• DOI: 10.1016/0168-9002(91)90127-c