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A Bayesian Goodness of Fit Test and Semiparametric Generalization of Logistic Regression with Measurement Data

✍ Scribed by Schörgendorfer, Angela; Branscum, Adam J.; Hanson, Timothy E.

Book ID: 120030983
Publisher: John Wiley and Sons
Year: 2013
Tongue: English
Weight: 676 KB
Volume: 69
Category: Article
ISSN: 0006-341X
DOI: 10.1111/biom.12007

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