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A Bayesian framework for deformable pattern recognition with application to handwritten character recognition

✍ Scribed by Kwok-Wai Cheung; Dit-Yan Yeung; Chin, R.T.


Book ID
117873529
Publisher
IEEE
Year
1998
Tongue
English
Weight
302 KB
Volume
20
Category
Article
ISSN
0162-8828

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