A Bayesian estimate of reliability in the Weibull distribution : Y. G. Jayaram. Microelectron. & Reliab.13, 29 (1974)

• Publisher: Elsevier Science
• Year: 1974
• Tongue: English
• Weight: 128 KB
• Volume: 13
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(74)90336-9