A 55-ns 16-Mb DRAM with built-in self-test function using microprogram ROM

✍ Scribed by Takeshima, T.; Takada, M.; Koike, H.; Watanabe, H.; Koshimaru, S.; Mitake, K.; Kikuchi, W.; Tanigawa, T.; Murotani, T.; Noda, K.; Tasaka, K.; Yamanaka, K.; Koyama, K.

• Book ID: 119774725
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 759 KB
• Volume: 25
• Category: Article
• ISSN: 0018-9200
• DOI: 10.1109/4.58282