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966. Structural effect in thin films observed by electron microscopy of the film cross-section: C Kooy and J M Nieuwenhuizen,Basic Problems in Thin Film Physics: Proc Intern Symp, Gottingen, 1965, Publ Vandenhoeck and Ruprecht 1966, 181–187 (in German)

Publisher: Elsevier Science
Year: 1967
Tongue: English
Weight: 151 KB
Volume: 17
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(67)90968-2

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