✦ LIBER ✦
919. Measurement of the thickness of epitaxial films on silicon: V V Livshits and T P Komleva, Zav Lab, (6), 1965, 718, (in Russian)
- Publisher
- Elsevier Science
- Year
- 1965
- Tongue
- English
- Weight
- 121 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0042-207X
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