✦ LIBER ✦
896. Parameters of thin two-layer dielectric films on semiconducting substrates by the ellipsometric method: K K Svitashev et al, Optika Spektroskop, 32 (5), May 1972, 1020–1026 (in Russian)
- Publisher
- Elsevier Science
- Year
- 1973
- Tongue
- English
- Weight
- 166 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0042-207X
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