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852. Determination of structure of thin films by electron microscope examination: W van Itterbeek and R Coppens, Revue de la Société Royale des Ingénieurs et des Industriels, (5), May 1965, 247, (in French)


Publisher
Elsevier Science
Year
1965
Tongue
English
Weight
126 KB
Volume
15
Category
Article
ISSN
0042-207X

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