𝔖 Bobbio Scriptorium

✦ LIBER ✦

852. Determination of structure of thin films by electron microscope examination: W van Itterbeek and R Coppens, Revue de la Société Royale des Ingénieurs et des Industriels, (5), May 1965, 247, (in French)

Publisher: Elsevier Science
Year: 1965
Tongue: English
Weight: 126 KB
Volume: 15
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(65)90424-0

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