849. Comparison of two methods for measuring the thickness of thin coatings of oxide films on silicon: J. Eucinas, Le Vide, 18 (104), March/April 1963,95–99

• Publisher: Elsevier Science
• Year: 1963
• Tongue: English
• Weight: 131 KB
• Volume: 13
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(63)91136-9