✦ LIBER ✦
822. Optical thickness measurement of thin transparent films on silicon: F Reizman, J Appl Phys, 36 (12), Dec 1965, 3804–3807
- Book ID
- 107868667
- Publisher
- Elsevier Science
- Year
- 1966
- Tongue
- English
- Weight
- 150 KB
- Volume
- 16
- Category
- Article
- ISSN
- 0042-207X
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