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7676. An situ study of the reactive ion beam etching of tungsten with tetrafluoremethane/argon mixtures using ion scattering spectroscopy and secondary ion mass spectrometry: T I Cox et al,J Vac Sci Technol, A8, 1990, 1685–1689


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
143 KB
Volume
42
Category
Article
ISSN
0042-207X

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