𝔖 Bobbio Scriptorium
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7664. The relation between lift-off of photoresist and the surface coverage of trimethylsiloxy groups on silicon wafers: a quantitative time-of-flight secondary ion mass spectroscopy and contact angle study: J J Ponjeé et al,J Vac Sci Technol, B8, 1990, 463–466


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
154 KB
Volume
42
Category
Article
ISSN
0042-207X

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